International Journal of VLSI Circuit Design & Technology is a print and e-journal focused towards the rapid publication of fundamental research papers on all areas of Electronic Design Technologies.


International Journal of VLSI Circuit Design & Technology

Journal Abbreviation


Issues Per Year

2 issues


STM Journals, An imprint of Consortium e-Learning Network Pvt. Ltd.




STM Journals, An imprint of Consortium e-Learning Network Pvt. Ltd.

Starting Year



Electronics & Telecommunication Engineering



Publication Format

Hybrid, and Open Access

Type of Publication

Peer-reviewed Journal (Refereed Journal)



STM Journals, An imprint of Consortium e-Learning Network Pvt. Ltd.
A-118, 1st Floor, Sector-63, Noida, U.P. India, Pin - 201301


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Refreed Journal

Focus and Scope Covers

  • CMOS technologies and SPICE Models: CMOS technology, SPICE, Semiconductor device modeling, Electrostatic discharge, Protection, Stress, MOS devices, Circuits, Design methodology, Voltage, technology CAD (electronics), CMOS analog integrated circuits, TCAD, analog CMOS technology.
    • Stability and Noise issues in amplifiers: Linearity, BiCMOS integrated circuits, Low-noise amplifiers, Linearization techniques, Noise figure, Radiofrequency amplifiers, Radiofrequency, Power engineering, and energy, Impedance matching, Energy consumption, BiCMOS low noise amplifier linearity, narrowband LNA topology, intermodulation distortion, noise performance.
    • Frequency response: Frequency measurement,Photodetectors,Harmonic analysis,Radio frequency,Optical modulation,RF signals,Optical interferometry,Phase modulation,Optical mixing,swept frequency method,radio-frequency signal.
    • CMOS analog blocks: Current Sources and Voltage references: Circuit testing, Circuit faults, Design for testability, Mixed analog-digital integrated circuits, Integrated circuit testing, Analog integrated circuits, CMOS analog integrated circuits, CMOS integrated circuits, Circuit analysis, Power supplies, parametric yield degradation.
    • Differential amplifier, OPAMP, and OTA design: Robust folded cascode OpAmp, compact low power folded cascode OpAmp, high EMI immunity, compact folded cascode operational amplifier,first-stage folded cascade OpAmp, compact folded cascade OpAmp, classical folded cascade OpAmp, telescopic OTA, CMOS technology, operational transconductance amplifier,pass-band frequency, sixth order BLPF, sixth order Butter-worth low pass filter, UGB, PSRR, power dissipation, Cadence Spectre tool, frequency response, Differential amplifiers, Broadband amplifiers, Pulse amplifiers, Stability, Capacitance, Coupling circuits, Low pass filters, Detectors, Output feedback, High speed integrated circuits.
    • Frequency Synthesizers and Phased lock-loop: Automatic frequency control, Phase locked loops, Calibration, Frequency synthesizers, Clocks, Voltage-controlled oscillators, Frequency control, Time measurement, Circuits, CMOS process, frequency synthesizer, AFC operation, frequency control code, frequency difference, reference clock, VCO clock, AFC circuit,
    • Non-linear analog blocks: Comparators, Charged-pump circuits, and Multipliers: current-mode nonlinear building blocks,floating-gate transistors, nonlinear computational circuit, MOS transistors, current square-root circuit, current squarer,four-quadrant current multiplier, large input range, low harmonic distortion, high linearity, MIETEC CMOS process parameters, Voltage control, High-voltage techniques, DC-DC power converters, Charge pumps, Load modeling, Adaptation models, SPICE, low-power sense comparator, voltage comparator.
    • Data converters: Analog-digital conversion,Signal design,Very large scale integration,Biomedical signal processing,Instruments,Analog circuits,Process design,Integrated circuit technology,Delta-sigma modulation,Radio frequency,delta-sigma data converters,sampling converters.
    • Analog Interconnects and Analog Testing and Layout: Analog circuits, Application specific integrated circuits, Integrated circuit testing, Analog integrated circuits mixed mode ICs, complementary signal set, test pattern, mixed-signal test, digital signal processing test system, nonperiodic pseudo-random signals, fault coverage, HSPICE simulator, output voltage simulation, supply current monitoring, digital signal processing, unified piece of test equipment
    • Low voltage and Low power Analog: ultra-low power SAR ADC, wireless sensing applications, portable low power wireless sensor systems, low power consumption, split capacitor array, dynamic comparator, analog-digital conversion, flip-flops,low-power electronics, wireless sensor network slow voltage, Transconductors, Frequency, Voltage-controlled oscillators, Capacitance, Instruments, Prototypes, Tuning, Circuits, Transconductance.
    • Electronic design automation: Design engineering, Design Automation, Electronic design automation and methodology, Embedded system, Economic forecasting, Time to market, Productivity, Design methodology, Supply chains, Companies, engineering design automation, chips design, electronics system design, embedded system design, system-level design, integrated circuit, electronic components, personal devices, societal devices.

Key Words

  • Semiconductor device modeling
  • Electrostatic discharge
  • Electronic Design Automation
  • CMOS Technolog
  • Transistors
  • Multivalued logic
  • Analog Design
  • CMOS Inverter
  • Data converter
  • Low power analog
  • Polynomial Regression
  • Design Engineering
  • Design automation
  • Phase locked loops


Submission of Paper: 

All contributions to the journal are rigorously refereed and are selected on the basis of quality and originality of the work. The journal publishes the most significant new research papers or any other original contribution in the form of reviews and reports on new concepts in all areas pertaining to its scope and research being done in the world, thus ensuring its scientific priority and significance.

Manuscripts are invited from academicians, students, research scholars and faculties for publication consideration.

Papers are accepted for editorial consideration via email [email protected]

Plagiarism: All the articles will be checked through Plagiarism Software before publication.  

Subject: Electronics & Telecommunication Engineering

Abbreviation: IJVCDT

Frequency: TWO issues per year