International Journal of VLSI Design and Technology (IJVDT) aim is to cover all aspects of VLSI technologies and their integration into recent technologies that are the focus of ongoing research. Journal has a wider scope including all major advancement in the technology and design that are related to VLSI. All articles presented here are peer-reviewed and are of good quality.
Type of Publication:
Peer-reviewed Journal
Journal DOI:
Started Since:
2022 Volume and Issues Per Year:
Volume 7 and 3 Issues per year
DRJI, Citefactor, Journal TOC, Google Scholar
Type of Access:
Subscription Based, Open Access
Mode of Subscription:
Print, Online and Print + Online Journals
Journals Pub, Dhruv Info Pvt. Ltd.
Online Publishing Platform:
Open Journal Systems
Country of Origin:

Focus and Scope:

• CMOS technologies and SPICE Models
• Frequency response, stability and Noise issues in amplifiers.
• CMOS analog blocks: Current Sources and Voltage references
• Differential amplifier, OPAMP and OTA design.
• Frequency Synthesizers and Phased lock-loop.
• Non-linear analog blocks: Comparators, Charged-pump circuits and Multipliers
• Data converters
• Analog Interconnects and Analog Testing and Layout
• 12 Low voltage and Low power Analog
• Electronic design automation

Keywords :

Electronic Design automation, CMOS Technology, Transistors, Multivalued logic, Analog Design, CMOS Inverter, data converter, low power analog, polynomial Regression


Submission of Paper:

All contributions to the journal are rigorously refereed and are selected on the basis of quality and originality of the work. The journal publishes the most significant new research papers or any other original contribution in the form of reviews and reports on new concepts in all areas pertaining to its scope and research being done in the world, thus ensuring its scientific priority and significance.

Manuscripts are invited from academicians, students, research scholars and faculties for publication consideration. Papers are accepted for editorial consideration through mail [email protected].

Plagiarism: All the articles will be checked through Plagiarism Software before publication.  

Subject: Electronics and Telecommunication